Calibration standard for high-resolution X-ray diffraction
SIAL/NIST2000 - NIST® SRM® 2000
Product Type: Chemical
| application(s) | general analytical |
| form | solid |
| grade | certified reference material |
| manufacturer/tradename | NIST® |
| packaging | pkg of 1 block |
| Quality Level | 100  |
| technique(s) | diffraction/scattering: suitable |
| Application: | This Standard Reference Material (SRM) offers the high-resolution X-ray diffraction (HRXRD) community SI-traceable Si (220) d-spacing in transmission, wafer miscut angle relative to the crystal plane, and the surface-to-Si (004) Bragg angle in reflection for the specified reference wavelength. |
| Features and Benefits: | Certified values for SRM 2000 are available and can be used to calibrate HRXRD instrumentation. Expiration details, along with instructions for use, are included on the NIST certificate. |
| General description: | Each unit of Standard Reference Material (SRM) contains 25 mm × 25 mm × 0.725 mm double-polished (100)-oriented, single-crystal Si specimens with a nominal 50 nm Si0.85Ge0.15 epitaxial layer and 25 nm Si cap. For more information, please refer to the SDS and COA. SRM 2000_cert  SRM 2000_SDS |
| Legal Information: | NIST is a registered trademark of National Institute of Standards and Technology |
| Legal Information: | SRM is a registered trademark of National Institute of Standards and Technology |
| Other Notes: | Please download a current certificate at nist.gov/SRM for current analytes and certified values. |
| RIDADR | NONH for all modes of transport |
| WGK Germany | WGK 3 |
| Flash Point(F) | Not applicable |
| Flash Point(C) | Not applicable |
| UNSPSC | 41116107 |